Zumbach Electronic AG
Measuring instruments
CHSwitzerland
1957
51-200

Static X-Ray measuring system for multiple dimensions

Static X-Ray measuring system for multiple dimensions

RAYEX S ® is a highly developed system based on x-ray tomography. During the extrusion process, RAYEX S measures the wall thickness, eccentricity, diameter, and ovality of multi-layer cables with XLPE and EPR insulation, multi-layer pipes with foam core, composite pipes, and multi-layer hose. RAYEX  S systems have been in use for years on various production lines and processes with great success.

Important Features:

- Measures thin semi-conductor and insulation layers down to 0.3 mm (.012 in.)
- Simultaneous and uninterrupted scanning in X and Y directions with highest precision
- High scan rate and screen update (every 1...3 s)
- Multi-colored, easy to understand display
- Automatic control, thanks to short measuring intervals
- High resolution and accuracy, thanks to "Micro Focus" beam and UMX x-ray source.

RAYEX® S
X-Ray Measurement Technology from ZUMBACH for Single and Multilayer Products
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last updated on
Thursday, April 25, 2024
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